The new era of "pro-active" statistics

Semiconductor components are manufactured with complex processes where many parameters interact and play a key role on the quality of the delivered product.  To achieve a supply of high quality products, the entire process is monitored closely.

The complexity of the manufacturing processes has led to a significant increase of monitored parameters, resulting in an exponential growth of stored process data. Electrical characterization, probe and final tests also bring large logs of valuable information. The databases which are generated by the process monitoring are so large that it is impossible to manually analyze the data.

Advanced Data Mining (ADM) technologies, also known as Knowledge Discovery in Databases (KDD), are able to provide quicker, consistent and more complete answers to the quality challenges faced by the semiconductor industry. ADM involves a broad range of tools such as statistics, automatic learning, pattern recognition, database technologies, visualization and artificial intelligence. Using Part Average Testing for increased product quality was the first use of collected data within the industry, but deeper knowledge of your process can be reached by analyzing collected data.

Through a deep analysis of manufacturing & test databases, ADM helps the semiconductor industry to:

• Rapidly identify the most critical parameters and reveal added value actions

• Pinpoint the defects root causes

• Reduce set up time

• Increase yield and productivity

• Improve the delivered quality level

• Decrease manufacturing process and product variability

• Reduces the time to detect and correct both process and design imperfections

PEPITe and B&A are working together to support the semiconductor industry while facing new challenges. Our expertise in advanced data mining solutions combined with a extensive experience of the semiconductor industry will help you succeed in your manufacturing imporvement projects.

To learn more about our solutions in

• Wafer fabrication
• Wafer probing
• Assembly
• Final Test

Contact us,

Philippe MACK, ph.mack@pepite.be, Data Mining Expert
Philippe BRIOT, philippe.briot@briotassociates.com, Semiconductor Expert